SEL-UP: A CAD tool for the sensitivity analysis of radiation-induced Single Event Latch-Up
نویسنده
چکیده
Space missions require extremely high reliable components that must guarantee correct functionality without incurring in catastrophic effects. When electronic devices are adopted in space applications, radiation hardened technology should be mandatorily adopted. In this paper we propose a novel method for analyzing the sensitivity with respect to Single Event Latch-up (SEL) in radiation hardened technology. Experimental results obtained comparing heavy-ion beam campaign demonstrated the feasibility of the proposed solution. 2013 Elsevier Ltd. All rights reserved.
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عنوان ژورنال:
- Microelectronics Reliability
دوره 53 شماره
صفحات -
تاریخ انتشار 2013